此产品为机械剥离单层二硫化钼，放置于SiO2/Si基底。 美国2D semiconductors进口。
Monolayer molybdenum disulfide (1H-MoS₂) flakes have been exfoliated from bulk molybdenum disulfide (2H-MoS₂) onto 90nm thermal oxide and measures from 5 micron up to 40 micron in size. Each sample contains at least one single-layer MoS₂ and is easy to find with the given x and y coordinates. Optical images and preliminary tests come with the product. Typically, single-layer MoS₂ show strong PL at 1.85-1.88 eV with 0.04 to 0.1eV FWHM, and the Raman peaks are located at 386cm-1 (E2g in-plane mode) and 404 cm-1 (A1g out-of-plane mode). Characterization Raman spectroscopy: Raman spectroscopy is data is taken on every single-layer flakes. Typically, flakes show two prominent Raman peaks at 386cm-1 (E2g- in plane-) and 404cm-1 (A1g out-of-plane) and the FWHM (full-width-at-half-maximum) is less than 5cm-1. Photoluminescence (PL): In the single layer form, molybdenum disulfide possesses direct band-gap at 1.85eV (670nm). PL measurements show strong PL peak located at 1.85eV (670nm) with 0.04-0.10 eV PL FWHM. Optical Microscope images: Each sample is inspected under the optical microscope and x-y coordinates are recorded.
• Sensors - detectors
• STM – AFM applications
• Molecular detection – binding
• Ultra-low friction studies
• Materials science and semiconductor research